Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...
From materials science to biological research, scientists have embraced Kelvin Probe Force Microscopy (KPFM) for measuring the likes of surface potential and work functions. KPFM reproduces the ...
Numerous measurement modes have been advanced to characterize mechanical, magnetic, electrical and thermal properties since Atomic Force Microscopy (AFM) was first developed [1]. Kelvin Probe Force ...
Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...
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