In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Polymers are crucial across multiple sectors, including food packaging, tire fabrication, adhesives, and medical‑grade plastics. Photothermal atomic force microscope‑based infrared spectroscopy ...

Atomic force microscopy (AFM) is a cornerstone technique for nanoscale manipulation, and has applications in nanoparticle assembly, biomolecule handling, semiconductor device manufacturing, etc.

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale imaging and fabrication, enabling both high-resolution surface characterisation and precise nanomachining. By ...

(a) A scanning electron microscope (SEM) image of the nanoneedle probe used for the measurements. (b) Elasticity map of a 1 µm × 1 µm area on the nuclear surface, showing the change in elasticity ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

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Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...